A Study of Sub-1-nm EOT and High Performance HfO2-based Gate Stacks on Germanium MOSFETs

碩士 === 國立聯合大學 === 電子工程學系碩士班 === 105 === In the thesis, we focused on the influence of high-k HfO2 for Ge MOSFETs, and the related experiments that were discussed in following five chapters. Chapter I includes the introduction and motivation for thesis. Chapter II is the study of varying the lo...

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Bibliographic Details
Main Authors: LI, HUI-HSUAN, 李慧萱
Other Authors: LIN, YU-HSIEN
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/00833455736248557514

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