Investigation of Interference of RF Test under Multi Sites using Near-Field System

• Main Authors: KO, WEI-CHIH, 柯韋智
• Other Authors: WU, SUNG-MAO
• Format: Others
• Language: zh-TW
• Published: 2017
• Online Access: http://ndltd.ncl.edu.tw/handle/nkm2xn

碩士 === 國立高雄大學 === 電機工程學系碩博士班 === 105 === Currently, integrated circuit (IC) in a chip includes more than million transistors. The working speed of chip gets faster than before. The requirement of the stability of radio frequency signal (RF signal) is also getting more important. In order to guarantee to meet the specification of the RF signal in IC, the test under the radio frequency is applied to verify the function of RF IC. The level of the power of RF signal is actually little. Hence, the test items which need the large value of signal-to-noise ratio (SNR) will be easily influenced. Under multi-site tests, the influence will be more obvious. In the thesis, the system of the near-field measurement will be applied to probe the power of electromagnetic (EM) field under single-site test and multi-site test. The thesis will investigate the electromagnetic inference (EMI) to the phase noise of RF oscillator test items. By the near-field system measurement, the distribution of EM field of the differential paths will be created under single site and multi sites. By the distributions from the different models and the different working frequency, the EMI on the load board will be analyzed.