Investigation of Interference of RF Test under Multi Sites using Near-Field System

碩士 === 國立高雄大學 === 電機工程學系碩博士班 === 105 === Currently, integrated circuit (IC) in a chip includes more than million transistors. The working speed of chip gets faster than before. The requirement of the stability of radio frequency signal (RF signal) is also getting more important. In order to guara...

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Bibliographic Details
Main Authors: KO, WEI-CHIH, 柯韋智
Other Authors: WU, SUNG-MAO
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/nkm2xn