Research on Dynamic Contact Reliability Analysis of Spring Probe under Current Load
碩士 === 國立高雄大學 === 電機工程學系碩博士班 === 105 === Most interfaces are using the spring probe to do chip or package testing that the major function is connecting the signal and power between DUT and ATE. The life time of the spring probe will most important performance but the life time specification of the s...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/01491952861788635804 |