Design and Development of Tip-scanning Atomic ForceMicroscope based on an Astigmatic Detection System
碩士 === 國立臺灣大學 === 機械工程學研究所 === 105 === Astigmatic atomic force microscope takes advantages of compact size and high bandwidth. Until now, only sample-scanning configuration, which takes more time to prepare sample in order to avoid changing scanning range, exists. This thesis proposes a tip-scanning...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/qjgywx |