Top-gated Black Phosphorus Thin Film Transistor with High-K Dielectric Layer
碩士 === 國立臺灣大學 === 電子工程學研究所 === 105 === In this thesis, material analysis are first investigated to study the fundamental properties of the exfoliated black phosphorus (BP). The thickness of BP flakes can be roughly determined by optical microscopy and atomic force microscopy (AFM). The orientation o...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/7mkt5v |