Test Methodology for Dual-rail Asynchronous Circuits
碩士 === 國立臺灣大學 === 電子工程學研究所 === 105 === With low power and variation-tolerant features, asynchronous methodologies have been widely used in advanced VLSI designs. Testing asynchronous circuits has become a very important practical issue. This research presents a new test methodology, including desi...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/kspegf |