An incremental simulation technique based on delta model for lifetime yield analysis
碩士 === 國立中央大學 === 電機工程學系 === 105 === With the advance of VLSI technology, the parameter shift due to device aging has increasingly impacts on circuit yield. The aging effects may degrade circuit performance and cause circuit failure after a period of time. As a result, aging analysis is necessary in...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/29333985777872985451 |