Testing and Diagnosis of Memristor-Based Nonvolatile SRAMs
碩士 === 國立中央大學 === 電機工程學系 === 105 === In modern system-on-chips (SOCs), static power consumption represents a significant portion of the chip power. Also, static random access memory (SRAM) typically occupies more than one half of the chip area. Therefore, the static power of a SOC is mainly constitu...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/14874910125147724652 |