Applying Data Mining Techniques to Wafer Retest Yield Prediction - A Case Study of K Company

Applying Data Mining Techniques to Wafer Retest Yield Prediction - A Case Study of K Company

碩士 === 國立交通大學 === 管理學院資訊管理學程 === 105 === There are many factors in the semiconductor wafer test that will affect the wafer test yield result. For the wafer test factory, time is money; thus, complete the chip test in shortest time can increase the company's capacity to maximize the revenue and...

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Bibliographic Details
Main Authors:	Wang, Hsien-Ching, 王憲旌
Other Authors:	Liu, Duen-Ren
Format:	Others
Language:	zh-TW
Published:	2017
Online Access:	http://ndltd.ncl.edu.tw/handle/qak875

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