Applying Data Mining Techniques to Wafer Retest Yield Prediction - A Case Study of K Company
碩士 === 國立交通大學 === 管理學院資訊管理學程 === 105 === There are many factors in the semiconductor wafer test that will affect the wafer test yield result. For the wafer test factory, time is money; thus, complete the chip test in shortest time can increase the company's capacity to maximize the revenue and...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/qak875 |