Frequency Resolved Admittance Spectroscopy Analysis and Simulation on InAs Quantum Dots Shottky Diode

碩士 === 國立交通大學 === 電子物理系所 === 105 === In this work, we focus on the frequency- resolved admittance spectroscopy of InAs/InGaAs dot-in-well layer embedded in a GaAs Schottky diode where the reverse bias is used to discharge the initially occupied energy levels. In the first part, the empirical results...

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Bibliographic Details
Main Authors: Hung, Ju-Yi, 洪如薏
Other Authors: Chen, Jenn-Fang
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/86shgp