Electrical properties and memory effects in self-oxidized MoOx/MoS2 transistor

碩士 === 國立交通大學 === 電子物理系所 === 105 === Mechanically exfoliated molybdenum disulfide (MoS2) flakes are dispersed on silicon substrates capped with a 300-nm thick silicon dioxide layer. The standard electron beam lithography and thermal evaporation were used to pattern Au leads on the MoS2 flakes. The a...

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Bibliographic Details
Main Authors: Wang, Po-Sheng, 王柏勝
Other Authors: Jian, Wen-Bin
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/6bfew8