Long-Range Coulomb Interaction, Neutral Defect Scattering, and Remote Dipole Scattering in HKMG Ultra-Short Channel FETs
博士 === 國立交通大學 === 電子研究所 === 105 === The continued scaling of electronic devices encounters the significant performance degradations, which have so far been observed and attributed to the source/drain plasmons, neutral defects and remote dipoles. Both neutral defect and remote dipoles are caused by s...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/36912155069672831867 |