Mechanical Properties Measurement of Submicrometer Ti-Ni Shape MemoryAlloys Thin Films
碩士 === 國立中興大學 === 精密工程學系所 === 105 === Ti-60 at%Ni thin films with thickness of 700nm were deposited on silicon nitride with and without chromium interlayer. Static and dynamic mechanical properties of these films were investigated by bulge test and using SEM, XRD for internal structure and crystalli...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/85089316001411275904 |