The Study of Testing Efficiency Enhancement in System Integration Chip at Circuit Probing

碩士 === 國立金門大學 === 電子工程學系碩士班 === 105

Bibliographic Details
Main Authors: Wang, Hong-Siou, 王宏修
Other Authors: Wu, Tian-Luu
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/67515760421293927346