Linear Regression-Based Searching for Minimum Supply Voltage in Semiconductor IC Testing
碩士 === 中華大學 === 資訊工程學系 === 105 === Vdd(min) is defined as the lowest supply voltage at which a device can work on right logic states. For 65nm and smaller process of CMOS VLSI manufacturing, the IDDQ based outlier analysis can not be used to detect the defects, and Vdd(min) testing is required analy...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54bf5h |