Investigation of Normally-off p-GaN Gate HEMTs and Diodes Using Low Damage Etching Technique

碩士 === 長庚大學 === 電子工程學系 === 105

Bibliographic Details
Main Authors: Bo Hong Li, 李柏宏
Other Authors: H. C. Chiu
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/g76m45