Investigation of Normally-off p-GaN Gate HEMTs and Diodes Using Low Damage Etching Technique
碩士 === 長庚大學 === 電子工程學系 === 105
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2017
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Online Access: | http://ndltd.ncl.edu.tw/handle/g76m45 |