| Summary: | 碩士 === 元智大學 === 電機工程學系 === 104 === Accelerated life tests have been widely used in reliability analysis. In many practical applications, degraded characteristics of products are used to estimate the life distribution of products operating in normal condition.
In this thesis, 1N4148 diode is selected for experiments. First, fifty diodes per group were baked to conduct accelerated life tests, the stress levels of temperature were 125℃, 140℃, and 150℃ respectively, and the reverse voltages were recorded in each test. Activation average energy can be calculated by Arrhenius model, and the life of 1N4148 diode operating at 50℃ can be estimated to be 2,076,480 hours. Life estimation method presented in this study can also be applied in similar problems in the future.
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