The life of the amplifier module of bias diode
碩士 === 元智大學 === 電機工程學系 === 104 === Accelerated life tests have been widely used in reliability analysis. In many practical applications, degraded characteristics of products are used to estimate the life distribution of products operating in normal condition. In this thesis, 1N4148 diode is selected...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26143821829958566294 |