Empirical Study on Patent Indicators and Patent Value by Multiple Regression Analysis
碩士 === 國立清華大學 === 科技法律研究所 === 104 === Patent transaction is becoming frequent through whole world, hence it’s necessary to study and analyze the relation among patent value and various patent indicators to develop patent value model. The subjects of this article are patents owned by Industrial Techn...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/66722006040884446168 |