Low-Voltage Operation of Flash Memory by Adopting Nitrogen-Incorporated ZrTiO4 and HfZrO as Charge Trapping Layer

碩士 === 國立清華大學 === 工程與系統科學系 === 104 === 因申請專利緣故,資料延後公開

Bibliographic Details
Main Authors: Shen, Yung Shao, 沈永紹
Other Authors: Wu, Yung Hsien
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/20357187966442875685