Study of SONOS Nonvolatile Memory with Double Stacked Si3N4 Trapping layer and Nanowires Gate-All-Around Structure

碩士 === 國立清華大學 === 工程與系統科學系 === 104 === In this study, the “SONOS Nonvolatile Memory with Double Stacked Nitride Trapping layer and Nanowires Gate-All-Around Structure”, the characteristics of memory are improved by oxidation trimming nanowires and doubled stacked silicon nitride fabrications. Compar...

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Bibliographic Details
Main Authors: Chiang, Yi Wei, 江一葦
Other Authors: Wu, Yung Chun
Format: Others
Language:en_US
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/40536091957557115117