Application of image sensor for semiconductor measurement methods

碩士 === 國立彰化師範大學 === 電子工程學系 === 104 === In this paper, we used CMOS camera to combine with optical system for semiconductor measurement methods. Secondary, we applied digital lock-in technology for fast measurement system. We performed a simulation for lock-in amplifier, and a technique for fast mea...

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Bibliographic Details
Main Authors: Huang,Chao-Jian, 黃朝建
Other Authors: Lin,Der-Yuh
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/34238542662493726083