A comprehensive study on novel stress memorization technique for nMOSFETs with Technology CAD
碩士 === 國立交通大學 === 電子物理系所 === 104 === In this thesis, we focus on a novel stress memorization technique – “Stress Proximity Free Technique”, which is used to enhance MOSFETs performance, and analyze the electrical characteristics with comprehensive study from fundamental principle to advanced semicon...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/68411549092737966069 |