Neural-Network-based Framework for Extracting Silicon Condition via On-chip Process Monitors
碩士 === 國立交通大學 === 電子工程學系 電子研究所 === 104 === This paper proposes a neural network based framework to identify circuit condition where the ring oscillator based process monitor is. As the process shrinks, the variation becomes serious issue on product manufacturing. Moreover, the variation of process p...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/17820889794874717204 |