Numerical Simulation of Program/Erase/Retention in Planar and GAA SONOS with Different Dielectrics
碩士 === 國立交通大學 === 電子工程學系 電子研究所 === 104 === In this thesis, we developed a complete and consistent program/erase/retention model which can evaluate the performance boosted by changing structure and dielectrics. According to our model, the program/erase window can be improved by using Gate-All-Around(...
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| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/2625k4 |