The abnormal manufacturing process diagnosis and aging process analysis on MOCVD MFC component data

碩士 === 國立交通大學 === 統計學研究所 === 104 === MFC is one part of the MOCVD system. The goal of this thesis is to figure out the normal/abnormal manufacturing process and aging process of MFC data. However, there is no standard way to identify the abnormal process of MTC data. This thesis uses statistical hyp...

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Bibliographic Details
Main Authors: Wong, Jia-Jyun, 翁嘉駿
Other Authors: Huang, Guan-Hua
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/40342501026263126251