Study of vertical interconnects of 3D IC: Cu3Sn joints and Au-to-Au direct bonding

博士 === 國立交通大學 === 材料科學與工程學系所 === 104 === With evolution of technology, more multi-function chips have be integrated into electronic devices. The “multi-function” means more transistors being placed onto the unit area of each electric component. In the aspect of electronic packaging, it makes smaller...

Full description

Bibliographic Details
Main Authors: Chiu, Wei-Lan, 邱韋嵐
Other Authors: Chen, Chih
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/hxtn26