MOSFET Prepared by Hot Wire Doping SOI Substrate and 3D Gas Sensor with TSV Technology

碩士 === 國立成功大學 === 微電子工程研究所 === 104 === As the MOSFET devices have been scaling down, short channel effects become serious problems for traditional bulk MOSFETs. As the result, alternative MOSFET structure has been proposed. Shallow doping profile is a solution. Shallow doping profiles in drain and s...

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Bibliographic Details
Main Authors: I-TzuHuang, 黃翊慈
Other Authors: Shoou-Jinn Chang
Format: Others
Language:en_US
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/25862078642695348599