Virtual Sample Generation Based on Nominal Attributes

碩士 === 國立成功大學 === 工業與資訊管理學系 === 104 === As the global competition getting more and more intense, it also leads to the shorter product life cycle. Reducing the time and cost of pilot-run can enhance the competitive ability of enterprises effectively, somehow the small dataset learning problems will a...

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Bibliographic Details
Main Authors: Tse-ShuWu, 吳則澍
Other Authors: Der-Chiang Li
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/76989788212643804963