Stress Analysis and Mobility Model for 3D FinFET

碩士 === 國立中興大學 === 電機工程學系所 === 104 === The stress distribution and magnitude of 3D FinFET cause by each process steps is studied in this work. SolidWorks is first applied to drawing the 3D FinFET structural diagram , and then , the ANSYS stress analysis simulator is utilized for simulating each proce...

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Bibliographic Details
Main Authors: Shuen-Yi Keng, 耿順一
Other Authors: Shu-Tong Chang
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/14913719739273682816