Analysis of Conducted Transient Noise Immunity and BCI Coupling Path for Chip and Board Level Application

碩士 === 逢甲大學 === 通訊工程學系 === 104

Bibliographic Details
Main Author: 呂政儀
Other Authors: 林漢年
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/95174111429025297301