Identifying Outliers in General Profiles Using Influence Function
碩士 === 國立中正大學 === 數學系統計科學研究所 === 104 === In recent Statistical Procss Control (SPC) applications, a manufacturing process or product is characterized by a profile, which is a functional relationship between a response variable and one or more explanatory variables over time. The presence of outliers...
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| Format: | Others |
| Language: | en_US |
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2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/10759072513059913484 |