Study on Laser Diode Accelerated Life Test Model-A Cause of 650nm AlGaInP Laser Diode
碩士 === 元智大學 === 工業工程與管理學系 === 103 === With the development of technology, the reliability and lifetime of the laser diode become higher and higher. It is an important task to reduce the test time and obtain accurate information by a proper accelerated life test method. In this thesis, the accelerate...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/f65rcs |