The Study of Model Parameter Optimization in Lead Scan Inspection by Taguchi Method
碩士 === 國立雲林科技大學 === 工業工程與管理系 === 103 === Lead Scan/ Ball Scan is applied inevitably in the production process of semiconductor assembly and trial production. Its primary function is to inspect the product appearance, such as lead/solder ball, printed content, position of placement… etc. The printing...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/475v39 |