Non-Contact Digital IC Testing system

碩士 === 國立臺北科技大學 === 電子工程系研究所 === 103 === In recent year, the consuming electronic industry is booming¸ and even automotive electronics are also rapidly rising. The current market demand of smart phone and wearable devices increased making integrated circuit demand is also increased. Since the volume...

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Bibliographic Details
Main Authors: Jun-Wei Li, 李駿瑋
Other Authors: 邱弘緯
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/zmqwew