Surface Defect Detection of Smartphone
碩士 === 國立臺北科技大學 === 自動化科技研究所 === 103 === This thesis proposes a novel defect detection algorithm for the surface defects of smartphone that overcomes the difficulty of low-contrast, non-uniform illumination, and low S/N ratio situations. Thers are two parts proposed in the image preprocessing. Fi...
Main Authors: | Wei-Yuan Hsiao, 蕭惟元 |
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Other Authors: | 陳金聖 |
Format: | Others |
Language: | zh-TW |
Online Access: | http://ndltd.ncl.edu.tw/handle/xja896 |
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