Surface Defect Detection of Smartphone

碩士 === 國立臺北科技大學 === 自動化科技研究所 === 103 === This thesis proposes a novel defect detection algorithm for the surface defects of smartphone that overcomes the difficulty of low-contrast, non-uniform illumination, and low S/N ratio situations. Thers are two parts proposed in the image preprocessing. Fi...

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Bibliographic Details
Main Authors: Wei-Yuan Hsiao, 蕭惟元
Other Authors: 陳金聖
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/xja896