A Color Interference Checking Chip Dicing Plan for Multiple Project Wafer Accelerated by Segment Tree

碩士 === 東海大學 === 資訊工程學系 === 103 === In the wafer production process, cost is an important factor. Due to the requirement of experimental or special purpose chips, for a lower cost consideration, multi-specification dice arrangements are needed to generate these chips. This study proposes a placement...

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Bibliographic Details
Main Authors: MinLong, Huang, 黃敏龍
Other Authors: ChihHsiong, Shih
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/73705083617757852548