Measurement of the electric double layer potential and ratio of the ion concentration by atomic force microscope

碩士 === 國立臺灣科技大學 === 機械工程系 === 103 === With the advance of the nano technology, nowadays there are more and more materials and devices which are relevant to nano dimension. This study deals with electric double layer (EDL) potential at solid/electrolyte interface within nano dimension. The measureme...

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Bibliographic Details
Main Authors: Zheng-Yan Wu, 吳政晏
Other Authors: Song-Jeng Huang
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/96869111471860468164