Process Yield Analysis for Single and Multivariate Profiles

博士 === 國立臺灣科技大學 === 工業管理系 === 103 === In many industrial applications, the quality of a process or product can be characterized by a functional relationship between a response variable and one or more explanatory variables which is referred to as profile. A single profile may contain hundred or thou...

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Bibliographic Details
Main Author: Yeneneh Tamirat Negash
Other Authors: Professor Fu-Kwun Wang
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/43432470626369469997