Improved Static Learning and Its Application to PODEM
碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === Reducing the automatic test pattern generation (ATPG) time is a crucial issue due to the increasing design complexity and the shrinking device feature sizes – more transistors to test and more fault models to cover. Although several learning-based ATPG acce...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/34737891052602214754 |