Improving Dynamic Compaction Efficiency by Search Space Partitioning Based Parallel ATPG
碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === Many parallel Automatic Test Pattern Generation (ATPG) techniques have been proposed to speed up the time-consuming test generation process. However, most of the parallel ATPG’s suffer test pattern inflation. This thesis proposes a dynamic compaction aware sea...
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| Language: | en_US |
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2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90489843007853272577 |
| Summary: | 碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === Many parallel Automatic Test Pattern Generation (ATPG) techniques have been proposed to speed up the time-consuming test generation process. However, most of the parallel ATPG’s suffer test pattern inflation.
This thesis proposes a dynamic compaction aware search space partitioning parallel ATPG that is based on a shared memory multi-threading system. The proposed ATPG can improve the dynamic compaction efficiency to reduce the test pattern count. Our technique implementation is also based on dynamic load balancing.
Our technique is validated by ITC99 benchmark circuits and two industry designs. Experimental results show that the proposed TPG can reduce the test pattern count by up to 18%.
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