Improving Dynamic Compaction Efficiency by Search Space Partitioning Based Parallel ATPG
碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === Many parallel Automatic Test Pattern Generation (ATPG) techniques have been proposed to speed up the time-consuming test generation process. However, most of the parallel ATPG’s suffer test pattern inflation. This thesis proposes a dynamic compaction aware sea...
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| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90489843007853272577 |