Investigations of the Surface Electric Structure of the Rashba Semiconductors BiTeBr by Fourier-Transform Scanning Tunneling Microscopy

碩士 === 國立臺灣大學 === 應用物理所 === 103 === In this work, we combined the results of scanning tunneling microscopic, spectroscopic and the Fourier-transform scanning tunneling microscopic (also called ’quasi- particle analysis’), and the chemistry and electronic structure known from the published literature...

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Bibliographic Details
Main Authors: Yen-Neng Lien, 連彥能
Other Authors: Minn-Tsong Lin
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/42340472617125258306