A Methodology for Alleviating Die Shift of Fan-Out Wafer-Level Packaging (FOWLP)

碩士 === 國立清華大學 === 資訊工程學系 === 103 === Fan-out Wafer Level Packaging (FOWLP), which performs the packaging of dies while still being part of the wafer, has attracted a lot of attention for advanced electronic products in recent years. However, in FOWLP, there is a mechanical problem, the die shift pro...

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Bibliographic Details
Main Authors: Lin, Hsueh Ju, 林雪如
Other Authors: Chang, Shih Chieh
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/72905735841760367651