Automated Robust Design Optimization of Analog Circuits Considering Process Variations and Aging Effects
博士 === 國立中央大學 === 電機工程學系 === 103 === With shrinking device size in deep submicron process, many non-ideal effects impact circuit performances critically. If those non-ideal effects can be considered in the early design stage, the re-design and re-spin cost can be avoided. Thus, a reliable design flo...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/29034919828407087555 |