Measurement and Simulation of Dynamic Characteristics of GaN Power Transistors by DPT
碩士 === 國立交通大學 === 機械工程系所 === 103 === This paper describes the principles of double-pulse tester (DPT) and analyze the function of each component in the architecture. Then, apply the double-pulse tester to measure the dynamic characteristics of the NCTU GaN power transistor ,which include dynamic sw...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/61478893944103014832 |