Exploring Surface Structure and Electronic Properties of Reduced Graphene Oxide by Scanning Probe Microscopy
碩士 === 國立交通大學 === 電子物理系所 === 103 === In this experiment, we explore the surface structure and electronic properties of reduced grapheme oxide (rGO) by scanning tunneling microscopy (STM) and atomic force microscopy (AFM) in order to study the ordered patterns on rGO surface. The AFM images of rGO re...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/93162925446038632147 |